Special edition: Product Inspection

Mettler-Toledo launches OEE Reporting Feature for Profile and Signature Touch Metal Detectors

Mettler-Toledo launches OEE Reporting Feature

Mettler-Toledo has launched an Overall Equipment Effectiveness (OEE) Reporting Feature for its Profile, Profile Advantage and Signature Touch metal detectors using an existing RS232 and Ethernet interface or through its Safeline Metal Detection’s Fieldbus Interface Module (FIM).

By streamlining the collection of OEE data, operatives can analyse consistent types of information with reporting data from other machines on the line.

With the rising cost of raw ingredients and increased global competition, food and beverage manufacturers are growing more and more concerned about OEE and production line efficiency,” said Jonathan Richards, head of marketing, Mettler-Toledo Safeline Metal Detection.

With these enhancements for our metal detection systems, manufacturers can benefit from greater insight into their production lines’ performance, enabling them to take steps to maximise efficiency.”

The feature enables manufacturers to access and download data such as alarm history, faults and warnings, and changeover information, in the same way they do with their other pieces of equipment to understand how efficiently the machine is operating.

In addition to their OEE reporting enhancement, the Profile, Profile Advantage and Signature Touch metal detection systems are enabled for Packaging Machine Language (PackML) v3.0 – the most recent version of PackML created by the Organisation for Machine Automation and Control (OMAC).

PackML v3.0 simplifies machine-to-machine integration, which allows OEE data to be extracted from the metal detector and viewed on remote interfaces in an easy-to-read and industry standardised manner.

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